...
首页> 外文期刊>Journal of Applied Physics >Mechanical stress altered electron gate tunneling current and extraction of conduction band deformation potentials for germanium
【24h】

Mechanical stress altered electron gate tunneling current and extraction of conduction band deformation potentials for germanium

机译:机械应力改变的电子栅隧穿电流和锗导带形变电势的提取

获取原文
获取原文并翻译 | 示例
           

摘要

Strain altered electron gate tunneling current is measured for germanium (Ge) metal-oxide-semiconductor devices with HfO_2 gate dielectric. Uniaxial mechanical stress is applied using four-point wafer bending along [100] and [110] directions to extract both dilation and shear deformation potential constants of Ge. Least-squares fit to the experimental data results in Ξ_d and Ξ_u of -4.3±0.3 and 16.5±0.5 eV, respectively, which agree with theoretical calculations. The dominant mechanism for the strain altered electron gate tunneling current is a strain-induced change in the conduction band offset between Ge and HfO_2. Tensile stress reduces the offset and increases the gate tunneling current for Ge while the opposite occurs for Si.
机译:测量具有HfO_2栅极电介质的锗(Ge)金属氧化物半导体器件的应变改变后的电子栅极隧穿电流。使用沿[100]和[110]方向弯曲的四点晶片施加单轴机械应力,以提取Ge的膨胀和剪切变形电势常数。最小二乘拟合到实验数据的Ξ_d和Ξ_u分别为-4.3±0.3 eV和16.5±0.5 eV,这与理论计算相符。应变改变电子栅隧穿电流的主要机制是应变诱导的Ge和HfO_2之间的导带偏移变化。拉伸应力减小了偏移,并增加了锗的栅极隧穿电流,而硅则相反。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号