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首页> 外文期刊>Journal of Applied Physics >Electron Diffraction Studies of the Epitaxy of Cu Single Crystals. II. Early Stages of Epitaxy and Interfacial Dislocation Networks
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Electron Diffraction Studies of the Epitaxy of Cu Single Crystals. II. Early Stages of Epitaxy and Interfacial Dislocation Networks

机译:Cu单晶外延的电子衍射研究。二。外延和界面错位网络的早期阶段

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摘要

The first stages of epitaxy were investigated with reflection HEED methods for continuous Cu, Cu2O, and Ag films on Cu single‐crystal substrates. A new kind of diffraction pattern was obtained from the Cu{111} planes. It is produced by networks of interfacial dislocations. In case of the Cu layers, hexagonal arrangements of screw dislocations are formed in a pure twist boundary. The corresponding Burgers vectors are of the type ½〈110〉. For the Cu2O and Ag films, hexagonal and rhombohedric networks, respectively, of interfacial edge dislocations with Burgers vectors ⅙〈112〉 are probably present. The dislocation densities and modifications in the film lattice constants for the latter two epitaxial systems are in good agreement with values predicted by the theory of interfacial dislocations.
机译:通过反射HEED方法研究了外延的第一阶段,该方法用于在Cu单晶衬底上连续形成Cu,Cu2O和Ag膜。从Cu {111}面获得了一种新型的衍射图。它是由界面错位网络产生的。在Cu层的情况下,在纯扭曲边界中形成了螺钉位错的六边形排列。相应的Burgers向量的类型为½〈110〉。对于Cu2O和Ag薄膜,可能存在分别带有Burgers向量⅙〈112〉的界面边缘位错的六边形和菱形网络。后两个外延系统的位错密度和薄膜晶格常数的变化与界面位错理论预测的值非常吻合。

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  • 来源
    《Journal of Applied Physics》 |1966年第10期|共7页
  • 作者

    Krause G. O.;

  • 作者单位

    Metallurgical Research Laboratories, Syracuse University, Syracuse, New York;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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