Stacking fault, microtopography and thermal decomposition studies of Cr_xW_(1-x)Se_2 (x=0.25, 0.50, 0.75) single crystals

D.D. Patel; Priyanka Desai; A.R. Jani

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Stacking fault, microtopography and thermal decomposition studies of Cr_xW_(1-x)Se_2 (x=0.25, 0.50, 0.75) single crystals

机译：Cr_xW_（1-x）Se_2（x = 0.25，0.50，0.75）单晶的堆垛层错，微观形貌和热分解研究

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摘要

The single crystals of Cr_xWi_(1-x)Se_2 (x=0.25, 0.50, 0.75) have been grown by the chemical vapour transport (CVT) technique using iodine as a transporting agent. The structural characterisation of these crystals has been made by the X-ray diffraction (XRD) method. The lattice parameters, unit cell volume, crystallite size, strain and dislocation densities have also been evaluated for these new crystals. The estimation of growth and deformation fault probabilities is further calculated. The grown crystals were examined under an optical zoom microscope for their surface topography. Thermo gravimetry analysis (TGA) and differential thermogravimetry (DTG) were carried for the CVT grown Cr_xW_(1-x)Se_2 single crystals. The different kinetic parameters: entropy, enthalpy and Gibbs free energy were calculated using Piloyan-Novikova (P-N) and Coats-Redfern (C-R) relations.

机译：Cr_xWi_（1-x）Se_2（x = 0.25，0.50，0.75）的单晶已通过化学气相传输（CVT）技术使用碘作为传输剂进行了生长。这些晶体的结构表征是通过X射线衍射（XRD）方法进行的。这些新晶体的晶格参数，晶胞体积，微晶尺寸，应变和位错密度也得到了评估。进一步计算了生长和变形故障概率的估计。在光学变焦显微镜下检查生长的晶体的表面形貌。对CVT生长的Cr_xW_（1-x）Se_2单晶进行了热重分析（TGA）和差示热重分析（DTG）。使用Piloyan-Novikova（P-N）和Coats-Redfern（C-R）关系来计算不同的动力学参数：熵，焓和吉布斯自由能。

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来源
《Journal of Crystal Growth》 |2014年第15期|43-48|共6页
作者
D.D. Patel; Priyanka Desai; A.R. Jani;
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作者单位

Department of Physics, Sardar Patel University, Vallabh Vidyanagar 388120, Gujarat, India;

Department of Physics, Sardar Patel University, Vallabh Vidyanagar 388120, Gujarat, India;

Department of Physics, Sardar Patel University, Vallabh Vidyanagar 388120, Gujarat, India;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
原文格式 PDF
正文语种 eng
中图分类
关键词
A. Chalcogenides; C. X-ray diffraction; D. defects; Electron microscopy; Thermo gravimetry analysis (TGA);

机译：A.硫属元素化物;C. X射线衍射;D.缺陷;电子显微镜;热重分析（TGA）;

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Stacking fault, microtopography and thermal decomposition studies of Cr_xW_(1-x)Se_2 (x=0.25, 0.50, 0.75) single crystals

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