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Epitaxial growth of corundum-structured wide band gap Ⅲ-oxide semiconductor thin films

机译:刚玉结构宽带隙Ⅲ型氧化物半导体薄膜的外延生长

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摘要

We report fundamental issues and prospects of the rhombohedral corundum-structured Ⅲ-oxide (Ⅲ-O) alloy system constituted with α-M_2O_3 (M=metal element) materials. Successful epitaxial growth of α-Ga_2O_3 and α-In_2O_3 on sapphire (α-Al_2O_3) substrates has enabled the growth of α-(Al,Ga,In)_2O_3 semiconductor alloys, achieving the "band gap engineering" from 3.8 eV (an experimental value) to 8.8 eV. Transition-metal corundum-structured oxides (M=Cr, Fe, V, Ti) can be alloyed with the α-(Al,Ga, In)_2O_3 semiconductor alloys, leading to "function engineering", that is, to tailor the materials functions. The corundum-structured Ⅲ-O alloys will contribute to novel multifunctional devices in the future.
机译:我们报告了由α-M_2O_3(M =金属元素)材料构成的菱形刚玉结构的Ⅲ-氧化物(Ⅲ-O)合金体系的基本问题和前景。在蓝宝石(α-Al_2O_3)衬底上成功外延生长α-Ga_2O_3和α-In_2O_3使得α-(Al,Ga,In)_2O_3半导体合金得以生长,实现了3.8 eV的“带隙工程”(实验值)至8.8 eV。过渡金属刚玉结构的氧化物(M = Cr,Fe,V,Ti)可以与α-(Al,Ga,In)_2O_3半导体合金形成合金,从而导致“功能工程”,即定制材料功能。刚玉结构的Ⅲ-O合金将在未来为新型多功能器件做出贡献。

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