...
机译:Bi_4(Ge_xSi_(1-x))_ 3O_(12)混合晶体的Bridgman生长和表征
School of Materials Science and Engineering, Shanghai Institute of Technology, 120 Caobao Road, Shanghai 200235, PR China;
School of Materials Science and Engineering, Shanghai Institute of Technology, 120 Caobao Road, Shanghai 200235, PR China;
School of Materials Science and Engineering, Shanghai Institute of Technology, 120 Caobao Road, Shanghai 200235, PR China;
School of Materials Science and Engineering, Shanghai Institute of Technology, 120 Caobao Road, Shanghai 200235, PR China;
A2. Crystal growth; B1. Bi_4(Ge_xSi_(1-x))_3O_(12) crystal; B2. The Bridgman method;
机译:改进的垂直布里奇曼法生长的AgGa_(1-x)In_xSe_2(x = 0.5)单晶的生长和物理表征
机译:使用水平布里奇曼技术改善AgGa_xIn_(1-x)Se_2黄铜矿晶体的生长和表征
机译:旋转布里奇曼法生长InSb _((1-x))Bi_x晶体及其表征
机译:BRIDGMAN GA_(1-X)IN_SB的散装晶体的增长和表征,用于蒸镀应用
机译:在Bridgman环境中径向和轴向温度对硅(x)-锗(1-x)块状单晶生长的影响的研究。
机译:混合xWO3(1-x)Y2O3纳米厚膜在气敏应用中的表征
机译:Bridgman方法生长和氟化钙单晶的光谱表征
机译:Bridgman生长和表征Ga {sub 1 {minus} x} In {sub x} sb的块状单晶用于热光电应用