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首页> 外文期刊>Journal of Crystal Growth >Vertical Bridgman Growth Of Bi_(12)sio_(20) Crystal With Axial Vibration
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Vertical Bridgman Growth Of Bi_(12)sio_(20) Crystal With Axial Vibration

机译:Bi_(12)sio_(20)晶体在轴振动作用下的垂直Bridgman生长

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摘要

Bi_(12)SiO_(20) (BSO) single crystal was grown in the <2 2 0> direction by vertical Bridgman technique with axial vibration. The crystals grown with and without vibration have been characterized by X-ray rocking curves, chemical etching and optical transmission spectra. The results show that the quality of the crystal grown with vibration is more homogeneous. The size of the inclusions in crystal becomes smaller and the dislocation density is only 50% as low as that grown in the case of vibration. Furthermore, the optical transmittance is increased by about 10% compared with the crystal grown without vibration in the spectrum range of 600-800 nm.
机译:Bi_(12)SiO_(20)(BSO)单晶通过垂直Bridgman技术在轴向振动的作用下沿<2 2 0>方向生长。 X射线摇摆曲线,化学刻蚀和光透射光谱可以表征在有振动和无振动的情况下生长的晶体。结果表明,随着振动生长的晶体的质量更加均匀。晶体中夹杂物的尺寸变小,位错密度仅为振动时生长的位错密度的50%。此外,与在600-800nm光谱范围内无振动生长的晶体相比,光学透射率增加了约10%。

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