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Effect of anisotropic strain on phonons in a-plane and c- plane GaN layers

机译:各向异性应变对a平面和c平面GaN层中的声子的影响

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摘要

We have studied phonons in two types of anisotropically strained GaN films: c-plane GaN films grown on a-plane sapphire and a-plane GaN films grown on r-plane sapphire. The anisotropic strain in the films is determined by high-resolution X-ray diffraction (HRXRD) in different measuring geometries and the phonon parameters have been assessed by generalized infrared spectroscopic ellipsometry (GIRSE). The effect of strain anisotropy on GaN phonon frequencies is presented and the phonon deformation potentials a_(A_1(TO)), b_(A_1(TO)), c_(E_1(TO)) and c_(E_1(LO)) are determined.
机译:我们已经研究了两种类型的各向异性应变GaN膜中的声子:在a面蓝宝石上生长的c面GaN膜和在r面蓝宝石上生长的a面GaN膜。薄膜中的各向异性应变是通过高分辨率X射线衍射(HRXRD)在不同的测量几何形状中确定的,并且声子参数已通过广义红外光谱椭圆仪(GIRSE)进行了评估。提出了应变各向异性对GaN声子频率的影响,并确定了声子变形势a_(A_1(TO)),b_(A_1(TO)),c_(E_1(TO))和c_(E_1(LO))。

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