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首页> 外文期刊>Journal of Crystal Growth >Temperature-insensitive detectivity of 5-pair InAs/GaAs quantum-dot infrared photodetectors with asymmetric device structure
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Temperature-insensitive detectivity of 5-pair InAs/GaAs quantum-dot infrared photodetectors with asymmetric device structure

机译:具有不对称器件结构的5对InAs / GaAs量子点红外光电探测器的温度不敏感检测

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摘要

In this paper, 5-pair InAs/GaAs QDIPs with tunable dark current blocking barrier resulting from a p-type doped GaAs layer are fabricated. With a proper choice of the p-type doping density, temperature- insensitive detectivities up to 110 K at low applied voltage 0.8 V are obtained. The phenomenon is attributed to the one order of magnitude increase of photocurrent with increasing temperature resulting from the increase of transition probability with more available empty excited states at higher temperature. The results have shown superior high-temperature operation of the asymmetric QDIP structure than the symmetric device.
机译:在本文中,制造了具有p型掺杂GaAs层的具有可调暗电流阻挡势垒的5对InAs / GaAs QDIP。通过正确选择p型掺杂密度,可以在0.8 V的低施加电压下获得高达110 K的温度不敏感的探测率。该现象归因于光电流随着温度升高而增加一个数量级,这是由于在较高温度下具有更多可用的空激发态的跃迁概率增加而引起的。结果表明,非对称QDIP结构比对称器件具有更高的高温操作性能。

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