...
首页> 外文期刊>Journal of Crystal Growth >AiInP benchmarks for growth of AlGaInP compounds by organometrallic vapor-phase epitaxy
【24h】

AiInP benchmarks for growth of AlGaInP compounds by organometrallic vapor-phase epitaxy

机译:通过有机金属气相外延生长AlGaInP化合物的AiInP基准

获取原文
获取原文并翻译 | 示例
           

摘要

We have deomonstrated that source material and growth system purity can be successfully evaluated by characterizing AlInP samples grown by organometallic vapor-phase epitaxy with photocurrent versus voltage measurements in an electrochemical cell. The samples can be grown and characterized in about 1 h, making them well-suited for system benchmarks. Zn-doped AlInP has the greatest sensitivity for O contamination, a recurring problem in the growth of AlGaInP alloys.
机译:我们已经证明,通过用电化学电池中的光电流对电压测量来表征通过有机金属气相外延生长的AlInP样品,可以成功地评估源材料和生长系统的纯度。样品可以在大约1小时内生长并表征,使其非常适合系统基准测试。 Zn掺杂的AlInP对O污染的敏感性最高,这是AlGaInP合金生长中反复出现的问题。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号