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首页> 外文期刊>Journal of Crystal Growth >Modulation doped structure with thick strained InAs channel beyond the critical thickness
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Modulation doped structure with thick strained InAs channel beyond the critical thickness

机译:具有超过临界厚度的应变应变InAs通道的调制掺杂结构

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摘要

We successfully realized a modulation-doped structure on InP substrate with a thick strained InAs channel, which was twice thicker than the previously reported critical thickness. In our structure, an AlAs layer was inserted between an InAlAs spacer laeyr and the thick strained InAs channel to prevent two-dimensional to three-dimensional transition at the InAlAs/IOnAs heteroniterface. Using aw thick (7 nm) strained InAs layer as a channel, we simultaneously achieved a high electron mobiltiy of 18 500 cm~2/Vs and high sheet carrier density of 3.13×10~12 cm~-2 in the modulation doped structure on InP substrate.
机译:我们成功地在具有厚应变InAs沟道的InP衬底上实现了调制掺杂结构,该结构的厚度是以前报道的临界厚度的两倍。在我们的结构中,将AlAs层插入InAlAs间隔层和较厚的应变InAs通道之间,以防止InAlAs / IOnAs异质面的二维到三维过渡。以aw厚(7 nm)的应变InAs层为沟道,我们在调制掺杂结构中同时实现了18 500 cm〜2 / Vs的高电子迁移率和3.13×10〜12 cm〜-2的高片载流子密度。 InP基板。

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