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首页> 外文期刊>Journal of Crystal Growth >Influence of rapid thermal annealing on InAs/InAlAs/InP quantum wires with different InAs deposited thickness
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Influence of rapid thermal annealing on InAs/InAlAs/InP quantum wires with different InAs deposited thickness

机译:快速热退火对具有不同InAs沉积厚度的InAs / InAlAs / InP量子线的影响

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摘要

We have studied the effect of the post-growth rapid thermal annealing on optical and electrical properties of InAs/InAlAs/InP quantum wires with various InAs deposited thickness. Quite different annealing behaviors in photoluminescence and dark resistance are observed, which can be attributed to dislocations in samples. After annealing at 800 degrees C, quantum wires still exist in the sample with two monolayer InAs deposited thickness, but the temperature-dependent PL properties are changed greatly due to the intermixing of In/Al atoms. (c) 2005 Elsevier B.V. All rights reserved.
机译:我们研究了生长后快速热退火对具有各种InAs沉积厚度的InAs / InAlAs / InP量子线的光学和电学性质的影响。观察到在光致发光和暗电阻方面的退火行为有很大不同,这可以归因于样品中的位错。在800摄氏度下退火后,样品中仍然存在具有两个单层InAs沉积厚度的量子线,但是由于In / Al原子的混合,与温度相关的PL特性发生了很大变化。 (c)2005 Elsevier B.V.保留所有权利。

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