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首页> 外文期刊>Journal of Crystal Growth >Dewetted growth and characterisation of high-resistivity CdTe
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Dewetted growth and characterisation of high-resistivity CdTe

机译:高电阻率CdTe的去湿法生长和表征

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摘要

Undoped and Ge-doped CdTe crystals have been grown using the dewetting phenomenon on the earth. A gap effected by the dewetting between the crystal and ampoule was created with a thickness up to 60 μm, but it was not stable for the complete growth process. The dewetting was stable for the first 25 mm of the growth, but than it got unstable. The main deteriorating factor was a change of a liquid-solid interface shape from the convex to concave. Structural, electrical, photoelectrical and optical characteristics of the studied samples showed better material quality in dewetted areas.
机译:利用地球上的去湿现象可以生长出未掺杂和锗掺杂的CdTe晶体。晶体和安瓿之间因去湿而产生的缝隙形成的厚度最大为60μm,但对于整个生长过程而言并不稳定。在生长的前25毫米,去湿是稳定的,但是变得不稳定。主要的恶化因素是液-固界面形状从凸形变为凹形。所研究样品的结构,电,光电和光学特性表明其在润湿区域具有更好的材料质量。

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