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首页> 外文期刊>Journal of Crystal Growth >MOCVD growth of asymmetric 980 nm InGaAs/InGaAsP broad-waveguide diode lasers for high power applications
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MOCVD growth of asymmetric 980 nm InGaAs/InGaAsP broad-waveguide diode lasers for high power applications

机译:用于高功率应用的不对称980 nm InGaAs / InGaAsP宽波导二极管激光器的MOCVD生长

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摘要

Asymmetric 980 nm InGaAs/InGaAsP laser structures have been grown by low-pressure metalorganic chemical vapor deposition, and broad-waveguide diode lasers of very large equivalent transverse spot size (0.80 nm) have been fabricated. High-quality, relatively thick (> 0.7 μm), high-bandgap InGaAsP (E_g = 1.80 eV) layers were developed, as needed for the successful implementation of a device design for high-power, single-transverse-mode operation. Uncoated 100-μm-wide stripe, 2-mm-long lasers exhibit a threshold-current density of 188 A/cm~2, an internal loss coefficient of 1.4cm~(-1), a differential quantum efficiency of 66%, and high characteristic temperatures for the threshold-current density and the external quantum efficiency (i.e., T_0 = 190 K and T_1 = 520 K).
机译:通过低压金属有机化学气相沉积已经生长了不对称的980 nm InGaAs / InGaAsP激光器结构,并且已经制造了相当大的等效横向光斑尺寸(0.80 nm)的宽带波导二极管激光器。根据成功实现高功率单横模工作器件设计的需要,开发了高质量,相对较厚(> 0.7μm),高带隙的InGaAsP(E_g = 1.80 eV)层。未镀膜的100μm宽条纹,2mm长的激光器的阈值电流密度为188 A / cm〜2,内部损耗系数为1.4cm〜(-1),差分量子效率为66%,并且阈值电流密度和外部量子效率所需的高特征温度(即T_0 = 190 K和T_1 = 520 K)。

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