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首页> 外文期刊>Journal of Electronic Testing >Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST
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Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST

机译：用于ADC BIST的基于振荡器的可重配置正弦信号发生器

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摘要

In order to perform an on-chip test for characterizing both static and transmission parameters of embedded analog-to-digital converters (ADCs), this paper presents an oscillator-based reconfigurable sinusoidal signal generator which can produce both high and low frequency sinusoidal signals by switching the oscillator into different modes. Analog and digital signals can additionally be produced concurrently in both modes to provide not only test stimuli, but also reference responses for the ADC built-in self-test. The generated oscillation signal amplitude and frequency can be easily and precisely controlled by simply setting the oscillator clock frequency and initial condition coefficients. Except for a 1-bit digital-to-analog converter and smoothing filter, this proposed generator is constructed entirely by digital circuits, and hence easily integrates this silicon function and verifies itself before testing the ADCs.
机译：为了进行片上测试以表征嵌入式模数转换器（ADC）的静态和传输参数，本文提出了一种基于振荡器的可重构正弦信号发生器，该发生器可通过以下方式产生高频和低频正弦信号：将振荡器切换到不同的模式。此外，还可以同时在两种模式下同时产生模拟和数字信号，以不仅提供测试激励，而且还提供ADC内置自测试的参考响应。只需设置振荡器时钟频率和初始条件系数，就可以轻松而精确地控制生成的振荡信号幅度和频率。除了1位数模转换器和平滑滤波器外，该拟议的发生器完全由数字电路构成，因此可以轻松集成此芯片功能并在测试ADC之前对其进行验证。

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