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首页> 外文期刊>Journal of Electronic Testing >Electro-thermal Stimuli for MEMS Testing in FSBM Technology
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Electro-thermal Stimuli for MEMS Testing in FSBM Technology

机译:FSBM技术中用于MEMS测试的电热激励

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摘要

The development of low-cost goo-go procedures for MEMS production testing is one of the main issues of MEMS manufacturability. In particular, the generation of low-cost test stimuli is a real challenge. In this paper, we investigate the generation of electrically-induced thermal stimuli to test electro-mechanical structures. Static, transient and harmonic responses are studied and it is demonstrated that they can be used for efficient detection and classification of several faulty devices.
机译:MEMS生产测试的低成本通过/不通过程序的开发是MEMS可制造性的主要问题之一。特别是,低成本测试刺激的产生是一个真正的挑战。在本文中,我们研究了电感应热刺激的产生,以测试机电结构。研究了静态,瞬态和谐波响应,并证明它们可用于有效检测和分类几种故障设备。

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