...
  • 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Journal of engineering materials and technology >Probing Microstructure Dynamics With X-Ray Diffraction Microscopy
【24h】

Probing Microstructure Dynamics With X-Ray Diffraction Microscopy

机译：用X射线衍射显微镜探测微观结构动力学

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

We describe our recent work on developing X-ray diffraction microscopy as a tool for studying three dimensional microstructure dynamics. This is a measurement technique that is demanding of experimental hardware and presents a challenging computational problem to reconstruct the sample microstructure. A dedicated apparatus exists at beam-line 1-ID of the Advanced Photon Source for performing these measurements. Submicron mechanical precision is combined with focusing optics that yield ≈2 μm high × 1.3 mm wide line focused beam at 50 keV. Our forward modeling analysis approach generates diffraction from a simulated two dimensional triangular mesh. Each mesh element is assigned an independent orientation by optimizing the fit to experimental data. The method is computationally demanding but is adaptable to parallel computation. We illustrate the state of development by measuring and reconstructing a planar section of an aluminum polycrystal microstructure. An orientation map of ~90 grains is obtained along with a map showing the spatial variation in the quality of the fit to the data. Sensitivity to orientation variations within grains is on the order of 0.1 deg. Volumetric studies of the response of microstructures to thermal or mechanical treatment will soon become practical. It should be possible to incorporate explicit treatment of defect distributions and to observe their evolution.
机译：我们描述了我们最近的发展X射线衍射显微镜的工作，作为研究三维微观结构动力学的工具。这是一种需要实验硬件的测量技术，并提出了具有挑战性的计算问题以重建样品的微观结构。在高级光子源的光束线1-ID处存在专用设备，用于执行这些测量。亚微米机械精度与聚焦光学器件相结合，可在50 keV时产生≈2μm高×1.3 mm宽的线聚焦光束。我们的正向建模分析方法从模拟的二维三角形网格生成衍射。通过优化对实验数据的拟合，为每个网格元素分配一个独立的方向。该方法在计算上要求很高，但适用于并行计算。我们通过测量和重建铝多晶微结构的平面截面来说明发展状态。获得了约90个晶粒的定向图以及一个显示数据拟合质量的空间变化的图。晶粒内取向变化的敏感性约为0.1度。微观结构对热处理或机械处理响应的体积研究将很快变得实用。应该可以对缺陷分布进行显式处理并观察其演变。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号