Normalized analysis for the sensitivity optimization of integrated optical evanescent-wave sensors

Parriaux O.; Veldhuis G.J.

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Normalized analysis for the sensitivity optimization of integrated optical evanescent-wave sensors

机译：集成化e逝波传感器灵敏度优化的归一化分析

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Closed-form analytical expressions and normalized charts provide the conditions for the maximum sensitivity of transverse electric (TE) and transverse magnetic (TM) evanescent-wave step-index waveguide sensors. The analysis covers both cases where the measurand is homogeneously distributed in the semi-infinite waveguide cover, and where it is an ultrathin film at the waveguide-cover interface.

机译：闭式分析表达式和归一化图表为横向电（TE）和横向磁（TM）van逝波阶跃折射率波导传感器的最大灵敏度提供了条件。该分析涵盖了被测物均匀分布在半无限波导盖中以及在波导-覆盖界面处是超薄膜的两种情况。

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《Journal of Lightwave Technology》 |1998年第4期|P.573-582|共10页
作者
Parriaux O.; Veldhuis G.J.;
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正文语种 eng
中图分类无线电电子学、电信技术;
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Normalized analysis for the sensitivity optimization of integrated optical evanescent-wave sensors

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