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Quality Recovery Method of Interference Patterns Generated From Faulty MEMS Spatial Light Modulators

机译:故障MEMS空间光调制器产生的干涉图样的质量恢复方法

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摘要

Currently, microelectromechanical system (MEMS) spatial light modulators (SLMs) with numerous tiny mirrors that are controllable as a binary state are available. Such MEMS spatial light modulators are useful as holographic displays, optical tweezers, optical memories, reconfigurable lenses, etc. Although nonfault devices are always used for such applications, this paper clarifies that even if a part of a MEMS-SLM is faulty, the MEMS-SLM is useful for almost all commercial products related to the applications described above. Moreover, it is useful even as research equipment with a high degree of precision. This paper therefore presents the fault-tolerance analysis results of light intensity, contrast ratio, and spot size of interference pattern generated from a MEMS-SLM to clarify the allowable deteriorations of faulty MEMS-SLMs. Moreover, we propose a recovery method that a faulty MEMS-SLM can be used as a nonfaulty MEMS-SLM by exploiting excess laser power.
机译:当前,具有许多可作为二进制状态控制的微镜的微机电系统(MEMS)空间光调制器(SLM)可用。此类MEMS空间光调制器可用作全息显示器,光学镊子,光学存储器,可重新配置的镜头等。尽管无故障设备始终用于此类应用,但本文仍阐明,即使MEMS-SLM的一部分出现故障,MEMS -SLM适用于几乎所有与上述应用有关的商业产品。此外,它甚至可以用作高精度的研究设备。因此,本文提出了由MEMS-SLM产生的光强度,对比度和光斑尺寸的容错分析结果,以阐明有缺陷的MEMS-SLM的允许劣化。此外,我们提出了一种恢复方法,即通过利用多余的激光功率,可以将故障的MEMS-SLM用作无故障的MEMS-SLM。

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  • 来源
    《Lightwave Technology, Journal of》 |2016年第3期|910-917|共8页
  • 作者

    Watanabe Minoru;

  • 作者单位

    Department of Electrical and Electronic Engineering, Shizuoka University, Shizuoka, Japan;

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  • 原文格式 PDF
  • 正文语种 eng
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