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In situ transmission electron microscope study of interface sliding and migration in an ultrafine lamellar structure

机译:原位透射电子显微镜研究超细层状结构中界面的滑动和迁移

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摘要

The instability of interfaces in an ultrafine TiAl-(gamma)/Ti_3Al-(alpha_2) lamellar structure by straining at room temperature has been investigated using in situ straining techniques performed in a transmission electron microscope. The purpose of this study was to obtain experimental evidence to support the creep mechanisms based upon the interface sliding in association with a cooperative movement of interfacial dislocations, which was proposed previously to rationalize a nearly linear creep behavior of ultrafine lamellar TiAl alloys. The results reveal that the sliding and migration of lamellar interfaces can take place simultaneously as a result of the cooperative movement of interfacial dislocations, which can lead to an adverse effect in the performance of ultrafine lamellar TiAl alloy.
机译:使用在透射电子显微镜中执行的原位应变技术,研究了室温下应变导致的超细TiAl-(γ)/ Ti_3Al-(α_2)层状结构中界面的不稳定性。这项研究的目的是获得实验证据,以支持基于界面错位与界面位错的协同运动相关的界面滑动的蠕变机理,该理论先前提出来合理化超细层状TiAl合金的近线性蠕变行为。结果表明,界面错位的协同运动可同时发生层状界面的滑动和迁移,从而可能对超细层状TiAl合金的性能产生不利影响。

著录项

  • 来源
    《Journal of Materials Research》 |2006年第10期|p.2453-2459|共7页
  • 作者

    L.M. Hsiung; J. Zhou; T.G. Nieh;

  • 作者单位

    Lawrence Livermore National Laboratory, Chemistry and Materials Science Directorate, Livermore, California 94551;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;
  • 关键词

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