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首页> 外文期刊>Journal of Materials Research >Interfacial embrittlement by bismuth segregation in copper/tin-bismuth Pb-free solder interconnect
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Interfacial embrittlement by bismuth segregation in copper/tin-bismuth Pb-free solder interconnect

机译:铜/锡-铋-无铅焊料互连中铋偏析引起的界面脆化

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摘要

Microchemistry and mechanical properties of a copper/tin-bismuth Pb-free solder interconnect were examined in the as-reflowed and aged conditions by in situ auger fracture and interface fracture mechanics techniques. In the as-reflowed condition, the solder-copper interface was highly resistant to fracture, and the fracture mechanism was ductile with the crack path following the interface between the solder alloy and the copper tin intermetallic phase.
机译:通过原位螺旋钻断裂和界面断裂力学技术,在回流和老化条件下检查了铜/锡-铋-无铅焊料互连的微观化学和力学性能。在回流状态下,焊料-铜界面高度抗断裂,并且断裂机理具有延展性,其裂纹路径遵循焊料合金与铜锡金属间相之间的界面。

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