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首页> 外文期刊>Journal of materials science >Linear and nonlinear optical properties of RF sputtered (Pb,La)(Zr,Ti)O_3 ferroelectric thin films
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Linear and nonlinear optical properties of RF sputtered (Pb,La)(Zr,Ti)O_3 ferroelectric thin films

机译：射频溅射（Pb，La）（Zr，Ti）O_3铁电薄膜的线性和非线性光学性质

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摘要

Linear and nonlinear optical properties of (Pb,La)(Zr,Ti)O_3 (PLZT) ferroelectric thin films were presented in this paper. The PLZT ferroelectric thin films have been in situ grown on quartz substrates by radio-frequency (RF) magnetron sputtering at 650℃. Their crystalline structure and surface morphologies were examined by X-ray diffraction and atomic force microscopy, respectively. It can be found that the PLZT thin films exhibit well-crystallized perovskite structure and good surface morphology. The fundamental optical constants (the band gap energy, linear refractive index, and linear absorption coefficient) were obtained through the optical transmittance measurements. A Z-scan technique was used to investigate the optical nonlinearity of the PLZT thin films on quartz substrates. The films display the strong third-order nonlinear optical effect. A large and negative nonlinear refractive index n_2 is determined to be 1.21 x 10~(-6) esu for the PLZT thin films. All results show that the PLZT ferroelectric thin films have potential applications in optical limiting, switching, and modulated-type optical devices.
机译：本文介绍了（Pb，La）（Zr，Ti）O_3（PLZT）铁电薄膜的线性和非线性光学性质。 PLZT铁电薄膜已经通过在650℃下的射频（RF）磁控溅射在石英衬底上原位生长。它们的晶体结构和表面形态分别通过X射线衍射和原子力显微镜检查。可以发现，PLZT薄膜表现出良好的结晶钙钛矿结构和良好的表面形态。通过光学透射率测量获得基本光学常数（带隙能量，线性折射率和线性吸收系数）。使用Z扫描技术研究石英衬底上PLZT薄膜的光学非线性。这些膜表现出很强的三阶非线性光学效应。对于PLZT薄膜，大的负非线性折射率n_2被确定为1.21×10〜（-6）esu。所有结果表明，PLZT铁电薄膜在光学限制，转换和调制型光学器件中具有潜在的应用。

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