...
首页> 外文期刊>Journal of Materials Science >Effect of small amount of rare earth addition on electromigration in eutectic SnBi solder reaction couple
【24h】

Effect of small amount of rare earth addition on electromigration in eutectic SnBi solder reaction couple

机译:少量稀土对共晶SnBi焊料反应对中电迁移的影响

获取原文
获取原文并翻译 | 示例
           

摘要

Effect of small amount of rare earth (RE) addition on electromigration behavior of Cu/SnBi/Cu solder reaction couple (SRC) was investigated with current density of 5 × 103 A/cm2 at room temperature and 100 °C, respectively. Results indicate that tiny RE addition to eutectic SnBi solder alloy can make the energy of interfaces and grain boundaries decrease, restrain the movement of dislocations and grain boundary sliding. Therefore, phase segregation and IMC growth will be effectively suppressed which enhances the electromigration resistance.
机译:以5×10 3 A / cm 2的电流密度研究了少量稀土(RE)对Cu / SnBi / Cu焊料反应对(SRC)电迁移行为的影响分别在室温和100°C下。结果表明,在共晶SnBi焊料合金中添加微量RE可使界面能和晶界能量降低,抑制了位错运动和晶界滑动。因此,相分离和IMC的生长将被有效地抑制,从而增强了电迁移耐受性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号