首页> 外文期刊>Journal of the IEST >In-Situ Chemical Concentration Control for Wafer Wet Cleaning
【24h】

In-Situ Chemical Concentration Control for Wafer Wet Cleaning

机译:晶圆湿法清洗的原位化学浓度控制

获取原文
获取原文并翻译 | 示例
           

摘要

This paper demonstrates the use of conductivity sensors to monitor and control the concentration of RCA cleaning and hydrofluoric acid (HF) etching Solutions. Commercially available electrodeless con- Ductivity sensors were used to monitor and control the Concentration of these process solutions. A linear rela- Tionship between the conductivity of the solution and The chemical concentration was obtained within the Range studied. A chemical injection scheme was devel- Oped to maintain the chemical concentration within Specified limits.
机译:本文演示了使用电导率传感器来监视和控制RCA清洁和氢氟酸(HF)蚀刻溶液的浓度。使用市售的无电极电导率传感器来监视和控制这些工艺溶液的浓度。在所研究的范围内,获得溶液的电导率与化学浓度之间的线性关系。开发了化学注入方案,以将化学浓度保持在规定的范围内。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号