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X-Ray Stress and Diffraction Line Width Measurement by the Gaussian Curve and Parabola Methods

机译：高斯曲线和抛物线法测量X射线应力和衍射线宽

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摘要

In the Gaussian curve method, a simplified equation for calculating the standard deviation(s.d.) σ_p of a peak position p is derived to reveal factors affecting σ_p. Equations for evaluating a diffraction line width were also derived in the Gaussian curve and parabola methods. It is shown analytically that the background subtraction of a diffraction line has little effect on the peak position and stress in both methods. The effect of background subtraction was also investigated using quenched and tempered steel specimens having various diffraction line widths; the experimental results almost agreed with the theoretical values. The standard deviation σ_p increases proportionally to the line width, and it is inversely proportional to the root of the maximum diffracted x-ray intensity and the number of intensity data points n.
机译：在高斯曲线法中，导出了用于计算峰位置p的标准偏差（s.d.）σ_p的简化方程，以揭示影响σ_p的因素。在高斯曲线和抛物线法中也得出了评估衍射线宽度的方程式。分析表明，在两种方法中，衍射线的背景减影对峰位置和应力的影响均很小。还使用具有不同衍射线宽度的淬火和回火钢试样研究了背景扣除的影响。实验结果与理论值基本吻合。标准偏差σ_p与线宽成比例地增加，并且与最大衍射x射线强度的根和强度数据点的数量n成反比。

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