Effect of annealing temperature on the properties of pulsed magnetron sputtered nanocrystalline Ag:SnO_2 films

著录项

• 来源
  《Materials Chemistry and Physics》 |2012年第3期|1024-1028|共5页
• 作者

  A.Sivasankar Reddy; N.M.Figueiredo; H.C.Cho; K.S.Lee; A.Cavaleiro;

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• 作者单位

  SEC-CEMUC, Department of Mechanical Engineering, University of Coimbra, 3030-788 Coimbra, Portugal,Division of Advanced Materials Engineering, Kongju National University, Budaedong, Cheonan City, South Korea;

  SEC-CEMUC, Department of Mechanical Engineering, University of Coimbra, 3030-788 Coimbra, Portugal;

  Division of Advanced Materials Engineering, Kongju National University, Budaedong, Cheonan City, South Korea;

  Division of Advanced Materials Engineering, Kongju National University, Budaedong, Cheonan City, South Korea;

  SEC-CEMUC, Department of Mechanical Engineering, University of Coimbra, 3030-788 Coimbra, Portugal;

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• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  thin films; nanostructures; sputtering; crystal structure; electrical properties;

  机译：薄膜;纳米结构溅射晶体结构电性能;