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Temperature-dependent properties of Pd/GaN Schottky type hydrogen sensors with Cl_2 plasma surface treatments

机译:Cl_2等离子体表面处理的Pd / GaN肖特基型氢传感器的温度相关特性

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摘要

Temperature-dependent hydrogen sensing properties of Pd/GaN Schottky type sensors with different Cl_2 plasma surface treated times are studied and demonstrated. The sensing behaviors are studied in terms of Schottky barrier height variation △_(φB). sensing response S_r, and transient-state response times. The highest sensing response (S_r) values of 7.1 × 10~4 and 2.12 × 10~5 are obtained in forward- and reverse-bias voltages, respectively, upon exposure to a 10,000 ppm H_2/air gas at 30 ℃. In addition, a correspondingly large Schottky barrier height variation △_(φB) of 0.38 eV is found. This could be attributed to the effective dissociation of hydrogen molecules due to a rougher Pd surface and lower baseline current. Moreover, the studied devices with Cl_2 plasma surface treatment have a stable and widespread reverse voltage operation regime. From transient-state behaviors measurement, the studied device with a 30 s plasma surface treatment shows the overshooting phenomenon and fast response (recovery) time of 4 (5) s.
机译:研究并证明了具有不同Cl_2等离子体表面处理时间的Pd / GaN肖特基型传感器的温度依赖性氢感测特性。根据肖特基势垒高度变化△_(φB)研究传感行为。感应响应S_r和瞬态响应时间。在30℃下暴露于10,000 ppm H_2 /空气中时,在正向和反向偏置电压下,最高感测响应(S_r)值分别为7.1×10〜4和2.12×10〜5。另外,找到了0.38eV的相应的较大的肖特基势垒高度变化△_(φB)。这可能归因于较粗糙的Pd表面和较低的基线电流,从而使氢分子有效解离。而且,所研究的具有Cl_2等离子体表面处理的器件具有稳定且广泛的反向电压操作方案。根据瞬态行为测量,所研究的设备经过30 s等离子表面处理,显示出过冲现象和4(5)s的快速响应(恢复)时间。

著录项

  • 来源
    《Materials Chemistry and Physics》 |2012年第1期|150-157|共8页
  • 作者单位

    Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, 1 University Road, Tainan 70101, Taiwan, ROC;

    Department of Chemical Engineering, National Cheng-Kung University, 1 University Road, Tainan 70101, Taiwan, ROC;

    Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, 1 University Road, Tainan 70101, Taiwan, ROC;

    Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, 1 University Road, Tainan 70101, Taiwan, ROC;

    Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, 1 University Road, Tainan 70101, Taiwan, ROC;

    Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, 1 University Road, Tainan 70101, Taiwan, ROC;

    Chung Shan Institute of Science and Technology, Tao-Yuan, Taiwan, ROC;

    Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, 1 University Road, Tainan 70101, Taiwan, ROC;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    schottky diode; surface roughness; plasma treatment; GaN; Pd;

    机译:肖特基二极管表面粗糙度;等离子处理氮化镓;钯;

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