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首页> 外文期刊>Materials Science and Engineering >Comparative study of electrical properties of Cu_2Zn_xFe_(1-x)SnS_4 thin films
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Comparative study of electrical properties of Cu_2Zn_xFe_(1-x)SnS_4 thin films

机译：Cu_2Zn_xFe_（1-x）SnS_4薄膜电学性能的比较研究

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摘要

Cu2ZnxFe1-xSnS4 (CZFTS) multi-component powders were synthesized by direct melting of the constituent elements and the corresponding thin films were deposited by vacuum thermal evaporation technique. The structural and electrical properties were studied by the use of X-ray diffraction and impedance spectroscopy, respectively. X-ray Diffractogrammes indicating that the transition phase from stannite structure to kesterite structure has occurred with increasing the Zn conten. Although all post-sulfurized CZFTS thin films show that only CZFTS phase was present with preferential orientation along (1 1 2) plane. Electrical properties have been investigated by ac impedance spectroscopy measured in the range from 5 Hz to 13 MHz. All the complex impedance plots display one semicircle for CZFTS thin films indicating the grain response. The analysis of conductivity indicates that both AC and DC conductivities of materials increase with increasing temperature. The frequency and temperature dependence of AC conductivity supports the correlated barrier hopping (CBH) model. All the CZFTS thin films exhibit a-p type conductivity.
机译：通过直接熔融组成元素合成Cu2ZnxFe1-xSnS4（CZFTS）多组分粉末，并通过真空热蒸发技术沉积相应的薄膜。通过使用X射线衍射和阻抗谱分别研究了结构和电性能。 X射线衍射图表明，随着Zn含量的增加，已经发生了从亚锡酸盐结构到硅藻土结构的过渡相。尽管所有硫化后的CZFTS薄膜均显示仅CZFTS相沿（1 1 2）平面优先取向。通过在5 Hz至13 MHz范围内测得的交流阻抗谱研究了电性能。对于CZFTS薄膜，所有复数阻抗图均显示一个半圆，表明晶粒响应。电导率分析表明，材料的交流和直流电导率均随温度升高而增加。交流电传导率的频率和温度依赖性支持相关势垒跳跃（CBH）模型。所有的CZFTS薄膜都具有a-p型导电性。

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  • 来源
    《Materials Science and Engineering》 |2019年第1期|55-61|共7页
  • 作者

    Sebai M.; Trabelsi I.; Kanzari M.;

  • 作者单位

    Univ Tunis, Ecole Natl Super Ingn Tunis, Ave Taha Hussein Montfleury, Tunis 1008, Tunisia|Univ Tunis El Manar, Ecole Natl Super Ingn Tunis, Lab Photovolta & Mat Semicond, Tunis 1002, Tunisia;

    Univ Tunis El Manar, Ecole Natl Super Ingn Tunis, Lab Photovolta & Mat Semicond, Tunis 1002, Tunisia;

    Univ Tunis El Manar, Ecole Natl Super Ingn Tunis, Lab Photovolta & Mat Semicond, Tunis 1002, Tunisia|Univ Tunis, IPEITunis, Montfleury, Tunisia;

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  • 正文语种 eng
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  • 关键词

    CZFTS thin films; Thermal evaporation; Impedance spectroscopy;

    机译：CZFTS薄膜;热蒸发;阻抗谱;

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