Effects of continuous annealing on the performance of ZnO based metal-semiconductor-metal ultraviolet photodetectors

著录项

• 来源
  《Materials Science and Engineering》 |2014年第mayajuna期|67-71|共5页
• 作者

  Chunguang Tian; Dayong Jiang; Yajun Zhao; Qingfei Liu; Jianhua Hou; Jianxun Zhao; Qingcheng Liang; Shang Gao; Jieming Qin;

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• 作者单位

  School of Materials Science and Engineering, Changchun University of Science and Technology, Changchun 130022, China;

  School of Materials Science and Engineering, Changchun University of Science and Technology, Changchun 130022, China;

  School of Materials Science and Engineering, Changchun University of Science and Technology, Changchun 130022, China;

  Suzhou R&D Center, East China Institute of Photo-electronic, Norinco Group, Suzhou 215163, China;

  School of Materials Science and Engineering, Changchun University of Science and Technology, Changchun 130022, China;

  School of Materials Science and Engineering, Changchun University of Science and Technology, Changchun 130022, China;

  School of Materials Science and Engineering, Changchun University of Science and Technology, Changchun 130022, China;

  School of Materials Science and Engineering, Changchun University of Science and Technology, Changchun 130022, China;

  School of Materials Science and Engineering, Changchun University of Science and Technology, Changchun 130022, China;

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• 收录信息
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  ZnO; MSM photodetector; Anneal; Schottkv contact;

  机译：氧化锌;MSM光电探测器;退火;肖特科夫联系方式;