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Molecular dynamics simulation of defect formation and precipitation in heavily carbon doped silicon

机译:重碳掺杂硅中缺陷形成和析出的分子动力学模拟

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The precipitation process of silicon carbide in heavily carbon doped silicon is not yet fully understood. High resolution transmission electron microscopy observations suggest that in a first step carbon atoms form C-Si dumbbells on regular Si lattice sites which agglomerate into large clusters. In a second step, when the cluster size reaches a radius of a few nm, the high interfacial energy due to the SiC/Si lattice misfit of almost 20% is overcome and the precipitation occurs. By simulation, details of the precipitation process can be obtained on the atomic level. A recently proposed parametrization of a Tersoff-like bond order potential is used to model the system appropriately. Preliminary results gained by molecular dynamics simulations using this potential are presented.
机译:碳化硅在重碳掺杂的硅中的沉淀过程尚未完全了解。高分辨率透射电子显微镜观察表明,第一步,碳原子在规则的Si晶格位点上形成C-Si哑铃,并聚集成大簇。在第二步中,当团簇大小达到几纳米的半径时,由于SiC / Si晶格失配几乎导致20%的高界面能被克服,并发生了沉淀。通过模拟,可以在原子水平上获得沉淀过程的详细信息。最近提出的类似Tersoff的键序势的参数化用于对系统进行适当建模。提出了利用这种潜力通过分子动力学模拟获得的初步结果。

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