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Detection of ultrathin biological films using vacuum ultraviolet spectroscopic ellipsometry

机译：真空紫外光谱椭偏仪检测超薄生物膜

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摘要

Spectroscopic ellipsometry (SE) is a non-contact and a non-destructive optical technique used in characterization of thin films. It is widely used to determine optical constants, thickness in multilayer stacks and microstructure (voids, alloy fraction, or mixed phase composition). This paper reports on a systematic investigation of the optical properties of two different kinds of silane compounds: 3-aminopropyltriethoxysilane (APTES) and 3-glycidoxypropyltriethoxy-silane (GPS) as well as for immunoglobulin G (IgG) attached to these modified samples using vacuum ultraviolet spectroscopic ellipsometry (VUV-SE). VUV-SE is a newly developed technique and used to evaluate the strength and energy of the interband electronic excitations/transitions in these biofilms. The shorter wavelengths of VUV-SE increase sensitivity for detection of extremely thin adsorbed films at an interface (<10nm) and accurately determine optical properties of biological interactions/moieties on the surface. A Cauchy dispersion model was used to determine layer thicknesses in multilayer stacks and adsorption was accounted by including Gaussian shaped oscillators in the optical model. No measurable optical anisotropy is found for these films. The dielectric properties of the adsorbed films are reported in the 0.73-9.43 eV optical range.
机译：椭圆偏振光谱法（SE）是用于薄膜表征的非接触式和非破坏性光学技术。它广泛用于确定光学常数，多层堆叠中的厚度和微观结构（空隙，合金分数或混合相组成）。本文报告了系统研究两种不同类型的硅烷化合物的光学性质：3-氨基丙基三乙氧基硅烷（APTES）和3-环氧丙氧基丙基三乙氧基硅烷（GPS）以及使用真空将这些修饰样品附着的免疫球蛋白G（IgG）紫外光谱椭偏仪（VUV-SE）。 VUV-SE是一项新开发的技术，用于评估这些生物膜中带间电子激发/跃迁的强度和能量。 VUV-SE的较短波长提高了检测界面处（<10nm）的极薄吸附膜的灵敏度，并准确确定了表面上生物相互作用/部分的光学性质。使用柯西色散模型确定多层堆叠中的层厚度，并通过在光学模型中包括高斯形振荡器来说明吸收。这些薄膜没有发现可测量的光学各向异性。据报道，在0.73-9.43 eV光学范围内，吸附膜的介电性能。

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