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首页> 外文期刊>Materials Science and Engineering. B, Solid-State Materials for Advanced Technology >Simulation of suppression of floating-body effect in partially depleted SOI MOSFET using a Si_(1-x)Ge_x dual source structure
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Simulation of suppression of floating-body effect in partially depleted SOI MOSFET using a Si_(1-x)Ge_x dual source structure

机译:使用Si_(1-x)Ge_x双源结构抑制部分耗尽的SOI MOSFET浮体效应的仿真

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摘要

The effect of the Si_(1-x)Ge_x source with an underlying p~+ region on the suppression of the floating body effects in a partially depleted silicon-on-insulator (SOI) metal oxide silicon field effect transistor (MOSFET) is numerically investigated. Compared to a conventional SOI MOSFET, the kink effect and anomalous sub-threshold slope are reduced and the breakdown voltage is substantially increased. The detailed suppression mechanism is also studied. Our results suggest that the narrow bandgap Si_(1-x)Ge__x source and buried p~+ region are favorable to the dispersion of holes generated by impact ionization.
机译:从数字上看,Si_(1-x)Ge_x源具有下面的p〜+区对绝缘体上部分耗尽的SOI金属氧化物硅场效应晶体管(MOSFET)中浮体效应的抑制作用调查。与传统的SOI MOSFET相比,扭结效应和异常的亚阈值斜率降低了,击穿电压也大大提高了。还研究了详细的抑制机制。我们的结果表明,窄带隙Si_(1-x)Ge__x源和掩埋的p〜+区有利于碰撞电离产生的空穴的分散。

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