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A novel indirect read technique based SRAM with ability to charge recycle and differential read for low power consumption, high stability and performance

机译:一种新颖的基于SRAM的间接读取技术,具有充电循环和差分读取的能力,可实现低功耗,高稳定性和高性能

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摘要

Read noise insertion problem of conventional read method of 6T-SRAM cell has forced to think about indirect read. Indirect read though eliminates read noise insertion but also take away the capability to use differential sensing thus leading to more energy and time consumption. Charge recycling concept must be followed by the SRAM cell to reduce energy consumption. An indirect read technique based SRAM is proposed which is capable to follow differential sensing along with following charge recycling technique. Thus it makes the proposed SRAM cell high stable, fast and low energy consuming. Theoretical estimation states that write and read energy consumption of the proposed cell is 12.5% and 25% smaller than those of the compared RDFD-SRAM. Stability analysis shows that the read SNM of the proposed cell which is the most critical stability index is same as its retention SNM and is 317% of the read SNM of conventional 6T-SRAM. The delay analysis also states the fastness of proposed cell.
机译:传统的6T-SRAM单元读取方法的读取噪声插入问题迫使人们不得不考虑间接读取。间接读取虽然消除了读取噪声的插入,但也剥夺了使用差分感应的能力,从而导致更多的能源和时间消耗。 SRAM单元必须遵循电荷循环的概念,以减少能耗。提出了一种基于SRAM的间接读取技术,该技术能够跟随差分检测以及随后的电荷循环技术。因此,这使得所提出的SRAM单元高度稳定,快速且能耗低。理论估计表明,拟议单元的读写能耗比比较的RDFD-SRAM分别低12.5%和25%。稳定性分析表明,拟议单元的读取SNM是最关键的稳定性指标,与其保留SNM相同,是常规6T-SRAM读取SNM的317%。延迟分析还说明了所建议小区的牢度。

著录项

  • 来源
    《Microelectronics journal》 |2020年第3期|104723.1-104723.11|共11页
  • 作者

  • 作者单位

    Silicon Inst Technol Dept Elect & Instrumentat Bhubaneswar 751024 India;

    KIIT Deemed Be Univ Sch Elect Engn Bhubaneswar 751024 India;

    Natl Inst Technol Dept Elect & Commun Engn Rourkela 769008 India;

    Vellore Inst Technol Sch Elect Engn Amaravati India;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Charge recycling; Indirect read; Half-selected cell; Single ended write; SRAM; Leakage current;

    机译:充电回收;间接阅读;半选单元;单端写;SRAM;漏电流;

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