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首页> 外文期刊>Microelectronics journal >Convex corners undercutting and rhombus compensation in KOH with and without IPA solution on (110) silicon
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Convex corners undercutting and rhombus compensation in KOH with and without IPA solution on (110) silicon

机译:在(110)硅上使用和不使用IPA解决方案的情况下,在KOH中的凸角底切和菱形补偿

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摘要

The present investigation introduces convex corners undercutting and results of rhombus compensation patterns in 40% aqueous KOH solution and in KOH saturated with isopropanol (IPA) solution. All experiments are carried out on (110) silicon at 70℃. Undercuts take place on convex corners in both solutions. Moreover, the front etch planes governing undercut vary with solutions. Rhombus compensations are used to correct the undercut. Perfect acute corner without residue is obtained, and there are only some residue structures on both sides of obtuse convex corners in KOH with IPA solution, which are better results than those in pure aqueous KOH solution.
机译:本研究介绍了40%KOH水溶液和异丙醇(IPA)饱和KOH中的凸角底切和菱形补偿模式的结果。所有实验均在70℃的(110)硅上进行。在两种解决方案中,凸凹都发生在底角上。此外,控制底切的前蚀刻平面随解决方案而变化。菱形补偿用于纠正底切。获得了完美的无残留锐角,并且在IPA溶液中KOH的钝角凸角的两侧都只有一些残留结构,比纯KOH水溶液的结果更好。

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