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Life prediction of LED-based recess downlight cooled by synthetic jet

机译：合成射流冷却的LED嵌入式筒灯的寿命预测

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摘要

This paper details the adaptation and implementation of a proposed hierarchical model to the reliability assessment of LED-based luminaires. An Edison base - 6 in., compatible can, downlight - LED replacement bulb, cooled by active synthetic jets, is used as the test vehicle. Based on the identified degradation mechanisms and the experimentally obtained degradation rate of the cooling device, the reduction in the heat sink enhancement factor, and thus the increase in the LED junction temperature, is determined as a function of time. The degradation mechanisms of the dual-function power electronics - providing constant power to the LEDs and to the drivers of a series of synthetic jets - are also analyzed and serve as the basis for a hybrid model which combines these two effects on the luminaire lifetime. The lifetime of a prototypical luminaire is predicted from LED lifetime data using the degradation analyses of the synthetic jet and power electronics.
机译：本文详细介绍了拟议的层次模型对基于LED的灯具的可靠性评估的适应性和实现。爱迪生底座-兼容的6英寸罐，筒灯-由主动合成喷嘴冷却的LED替换灯泡用作测试工具。基于所识别的退化机理和通过实验获得的冷却装置的退化速率，确定散热增强因子的降低，从而确定LED结温的升高是时间的函数。还分析了双功能功率电子器件的退化机理-为LED和一系列合成喷嘴的驱动器提供恒定功率-并将其作为混合模型的基础，该模型结合了这两种对灯具寿命的影响。使用合成射流和功率电子器件的退化分析，可从LED寿命数据预测原型照明器的寿命。

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  • 来源
    《Microelectronics & Reliability》 |2012年第5期|p.937-948|共12页
  • 作者

    Bong-Min Song; Bongtae Han; Avram Bar-Cohen; Mehmet Arik; Rajdeep Sharma; Stan Weaver;

  • 作者单位

    Mechanical Engineering Department, University of Maryland, College Park, MD 20742, United States;

    Mechanical Engineering Department, University of Maryland, College Park, MD 20742, United States;

    Mechanical Engineering Department, University of Maryland, College Park, MD 20742, United States;

    Thermal Systems Laboratory, GE Global Research Center, Niskayuna, NY 12309, United States;

    Lifing Technologies Laboratory, GE Global Research Center, Niskayuna, NY 12309, United States;

    Microsystem & MicroFluidics Laboratory, GE Global Research Center, Niskayuna, NY 12309, United States;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
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