Single-defect phonons imaged by electron microscopy

Yan Xingxu; Liu Chengyan; Gadre Chaitanya A.; Gu Lei; Aoki Toshihiro; Lovejoy Tracy C.; Dellby Niklas; Krivanek Ondrej L.; Schlom Darrell G.; Wu Ruqian; Pan Xiaoqing

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Single-defect phonons imaged by electron microscopy

机译：电子显微镜上成像的单缺陷声子

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Crystal defects affect the thermal and heat-transport properties of materials by scattering phonons and modifying phonon spectra(1-8). To appreciate how imperfections in solids influence thermal conductivity and diffusivity, it is thus essential to understand phonon-defect interactions. Sophisticated theories are available to explore such interactions, but experimental validation is limited because most phonon-detecting spectroscopic methods do not reach the high spatial resolution needed to resolve local vibrational spectra near individual defects. Here we demonstrate that space- and angle-resolved vibrational spectroscopy in a transmission electron microscope makes it possible to map the vibrational spectra of individual crystal defects. We detect a red shift of several millielectronvolts in the energy of acoustic vibration modes near a single stacking fault in cubic silicon carbide, together with substantial changes in their intensity, and find that these changes are confined to within a few nanometres of the stacking fault. These observations illustrate that the capabilities of a state-of-the-art transmission electron microscope open the door to the direct mapping of phonon propagation around defects, which is expected to provide useful guidance for engineering the thermal properties of materials.

机译：晶体缺陷通过散射声子和修改声子谱（1-8）影响材料的热量和热传输性质。为了理解固体中的缺陷会影响导热性和扩散性，因此可以理解声子缺陷相互作用是必要的。可以探索这种相互作用的复杂理论，但实验验证是有限的，因为大多数校验光谱方法没有达到解决局部振动光谱附近的局部缺陷所需的高空间分辨率。在这里，我们证明了透射电子显微镜中的空间和角度分辨的振动光谱使得可以映射各个晶体缺陷的振动光谱。我们在立方碳化硅中的单个堆叠故障附近的声学振动模式中检测了几毫米振动的红色偏移，以及它们强度的大量变化，并发现这些变化限制在几纳米的堆叠故障内。这些观察结果说明了最先进的透射电子显微镜的能力将门打开到缺陷周围的声子传播的直接映射，这预期为工程提供了有用的材料的引导性。

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《Nature》 |2021年第7840期|65-69|共5页
作者
Yan Xingxu; Liu Chengyan; Gadre Chaitanya A.; Gu Lei; Aoki Toshihiro; Lovejoy Tracy C.; Dellby Niklas; Krivanek Ondrej L.; Schlom Darrell G.; Wu Ruqian; Pan Xiaoqing;
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作者单位

Univ Calif Irvine Dept Mat Sci & Engn Irvine CA 92697 USA|Univ Calif Irvine Irvine Mat Res Inst Irvine CA 92697 USA;

Univ Calif Irvine Dept Phys & Astron Irvine CA 92697 USA|Henan Univ Sch Mat Sci & Engn Key Lab Special Funct Mat Minist Educ Kaifeng Peoples R China;

Univ Calif Irvine Dept Phys & Astron Irvine CA 92697 USA;

Univ Calif Irvine Dept Phys & Astron Irvine CA 92697 USA;

Univ Calif Irvine Irvine Mat Res Inst Irvine CA 92697 USA;

Nion R&D Kirkland WA USA;

Nion R&D Kirkland WA USA;

Nion R&D Kirkland WA USA;

Cornell Univ Dept Mat Sci & Engn Ithaca NY 14853 USA|Kavli Inst Cornell Nanoscale Sci Ithaca NY USA|Leibniz Inst Kristallzuchtung Berlin Germany;

Univ Calif Irvine Dept Phys & Astron Irvine CA 92697 USA;

Univ Calif Irvine Dept Mat Sci & Engn Irvine CA 92697 USA|Univ Calif Irvine Irvine Mat Res Inst Irvine CA 92697 USA|Univ Calif Irvine Dept Phys & Astron Irvine CA 92697 USA;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);美国《化学文摘》(CA);
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1. Multi-slice frozen phonon simulations of high-angle annular dark field scanning transmission electron microscopy images of the structurally and compositionally complex Mo–V–Nb–Te oxide catalyst [J] . Thomas?Vogt, Douglas?A.?Blom Advanced Structural and Chemical Imaging . 2018,第1期

机译：结构和组成复杂的Mo–V–Nb–Te氧化物催化剂的高角度环形暗场扫描透射电子显微镜图像的多层冷冻声子模拟
2. Computer-assisted simulation of high-voltage electron microscopy using serial images recorded by conventional transmission electron microscopy. [J] . Pascher R, Berthold CH, Rydmark M Journal of Electron Microscopy . 2002,第2期

机译：高压电子显微镜的计算机辅助模拟，使用常规透射电子显微镜记录的串行图像。
3. Investigation of the structure and composition of a {111} incoherent Zr/ZrN interface containing ledges by high-resolution transmission electron microscopy, image simulation, electron energy-loss spectroscopy, energy-filtering transmission electron microscopy, and near-coincidence-site analysis [J] . P. Li, J. M. Howe, W. T. Reynolds Jr. Metallurgical and Materials Transactions A . 2006,第3期

机译：高分辨率透射电子显微镜，图像模拟，电子能量损失谱，能量过滤透射电子显微镜和近符合现场分析法研究包含壁架的{111}非相干Zr / ZrN界面的结构和组成
4. Role of electron-phonon scattering in production of absorption bands in electron microscopy [C] . O. A. Podsvirov International Workshop on New Approaches to High-Tech Materials . 1998

机译：电子 - 声子散射在电子显微镜中吸收带产生的作用
5. Vector space methods for surface reconstruction from one or more images acquired from the same view with application to scanning electron microscopy images. [D] . Karacali, Bilge. 2002

机译：用于从同一视图获取的一个或多个图像进行表面重建的向量空间方法，并应用于扫描电子显微镜图像。
6. Multi-slice frozen phonon simulations of high-angle annular dark field scanning transmission electron microscopy images of the structurally and compositionally complex Mo–V–Nb–Te oxide catalyst [O] . Douglas A. Blom, Thomas Vogt -1

机译：结构和组成复杂的Mo–V–Nb–Te氧化物催化剂的高角度环形暗场扫描透射电子显微镜图像的多层冷冻声子模拟
7. Imaging phonon dynamics with ultrafast electron microscopy: Kinematical and dynamical simulations [O] . Daniel X. Du, David J. Flannigan 2020

机译：具有超快电子显微镜的映像声子动力学：电动和动态模拟
8. Valence and phonon excitations in high-resolution electron microscopy. [R] . Z. L. Wang J. Bentley 1991

机译：高分辨率电子显微镜中的价电子和声子激发。

Single-defect phonons imaged by electron microscopy

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