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Origin of high critical currents in YBa_2Cu_3O_(7-δ) superconducting thin films

机译：YBa_2Cu_3O_（7-δ）超导薄膜中高临界电流的起源

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Thin films of the high-temperature superconductor YBa_2Cu_3O_(7-δ) exhibit both a large critical current (the superconducting current density generally lies between 10~(11) and 10~(12) Am~(-2) at 4.2 K in zero magnetic field) and a decrease in such currents with magnetic field that point to the importance of strong vortex pinning along extended defects. But it has hitherto been unclear which types of defect—dislocations, grain boundaries, surface corrugations and anti-phase boundaries—are responsible. Here we make use of a sequential etching technique to address this question. We find that both edge and screw dislocations, which can be mapped quantitatively by this technique, are the linear defects that provide the strong pinning centres responsible for the high critical currents observed in these thin films. Moreover, we find that the superconducting current density is essentially independent of the density of linear defects at low magnetic fields. These natural linear defects, in contrast to artificially generated columnar defects, exhibit self-organized short-range order, suggesting that YBa_2Cu_3O_(7-δ) thin films offer an attractive system for investigating the properties of vortex matter in a superconductor with a tailored defect structure.
机译：高温超导体YBa_2Cu_3O_（7-δ）的薄膜都显示出很大的临界电流（在4.2 K下零时，超导电流密度通常在10〜（11）和10〜（12）Am〜（-2）之间。磁场）以及此类电流随磁场的减小而表明，必须沿着扩展的缺陷牢固地旋涡固定。但是，到目前为止，尚不清楚哪种缺陷是造成缺陷的原因，这些缺陷包括位错，晶界，表面波纹和反相边界。在这里，我们利用顺序蚀刻技术来解决这个问题。我们发现，通过这种技术可以定量映射的边缘位错和螺钉位错都是线性缺陷，它们提供了强大的钉扎中心，这些钉扎中心负责在这些薄膜中观察到的高临界电流。此外，我们发现在低磁场下，超导电流密度基本上与线性缺陷的密度无关。与人工产生的柱状缺陷相比，这些自然的线性缺陷表现出自组织的短程有序，这表明YBa_2Cu_3O_（7-δ）薄膜为研究具有定制缺陷的超导体中涡旋物质的性质提供了一个有吸引力的系统。结构体。

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