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Equivalent Accelerated Life Testing Plans for Log-Location-Scale Distributions

机译：日志位置规模分布的等效加速寿命测试计划

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摘要

Accelerated life testing (ALT) is widely used to determine the failure time distribution of a product and the associated life-stress relationship in order to predict the product's reliability under normal operating conditions. Many types of stress loadings such as constant-stress, step-stress and cyclic-stress can be utilized when conducting ALT. Extensive research has been conducted on the analysis of ALT data obtained under a specified stress loading. However, the equivalency of ALT experiments involving different stress loadings has not been investigated. In this article, a log-location-scale distribution under Type I censoring is considered in planning ALT. An idea is provided for the equivalency of various ALT plans involving different stress loadings. Based on this idea, general equivalent ALT plans and some special types of equivalent ALT plans are explored. For demonstration, a constant-stress ALT and a ramp-stress ALT for miniature lamps are presented and their equivalency is investigated.
机译：加速寿命测试（ALT）被广泛用于确定产品的故障时间分布以及相关的寿命-应力关系，以便预测产品在正常操作条件下的可靠性。进行ALT时，可以利用多种类型的应力负载，例如恒定应力，阶跃应力和循环应力。已经对在指定应力载荷下获得的ALT数据进行了广泛的研究。但是，尚未研究涉及不同应力负荷的ALT实验的等效性。在本文中，在计划ALT时考虑了类型I审查下的日志位置范围规模分布。提供了等效于涉及不同压力负荷的各种ALT计划的想法。基于此思想，探索了一般的等效ALT计划和某些特殊类型的等效ALT计划。为了演示，给出了微型灯的恒应力ALT和斜应力ALT并研究了它们的等效性。

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