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Behaviour of electron density profiles and particle transport analysis in the RFX reversed field pinch

机译:RFX反向场收缩中电子密度分布的行为和粒子迁移分析

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Density profiles measured in RFX by a 13 chord mid-infrared(MIR)interferometer are found to be flat or hollow. Density gradients are large only in a region typically of the order of 2 to 4 cm from the edge. A detailed investigation of the form of the electron density profile during the current flat-top phase in different experimental conditions has been performed. The shape of the profile seems to depend only on the I/N(plasma current/line density)parameter, varying from flat or slightly peaked at high I/N to clearly hollow at low I/N. The systematic existence of stationary hollow density profiles implies the presence of an outward directed fluid velocity.
机译:发现使用13弦中红外(MIR)干涉仪在RFX中测得的密度分布图是平坦或空心的。密度梯度仅在通常距边缘约2至4 cm的区域中较大。在不同的实验条件下,对当前平顶相期间电子密度分布图的形式进行了详细研究。轮廓的形状似乎仅取决于I / N(等离子电流/线密度)参数,从高I / N时的平坦或略有峰值到低I / N时明显呈空心。静态中空密度分布的系统存在意味着存在向外定向的流体速度。

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