Electron cloud size measurement in silicon drift detectors and spatial resolution improvement

Crescio E; Nouais D

首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment >Electron cloud size measurement in silicon drift detectors and spatial resolution improvement

【24h】

Electron cloud size measurement in silicon drift detectors and spatial resolution improvement

机译：硅漂移探测器中电子云尺寸的测量和空间分辨率的提高

获取原文

获取原文并翻译 | 示例

掌桥外文数据库（机构版） >>

开具论文收录证明 >>

文献代查 >>

页面导航

摘要
著录项
相似文献
相关主题

摘要

A method for a high precision measurement of the electron cloud size as a function of the drift time in silicon drift detectors is presented and validated by simulations. A related technique to correct for systematic errors on the position measurement is applied to beam test data. The spatial resolution of the detector is significantly improved. (c) 2006 Elsevier B.V. All rights reserved.

著录项

来源
《Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment》 |2006年第1期|p. 475-481|共7页
作者
Crescio E; Nouais D;
展开▼
作者单位

Ist Nazl Fis Nucl, Sez Torino, I-10125 Turin, Italy;

展开▼
收录信息
原文格式 PDF
正文语种 eng
中图分类计量学;
关键词
silicon drift detectors; diffusion; resolution improvement;

机译：硅漂移检测器;扩散;分辨率提高;

相似文献

外文文献
中文文献
专利

1. Interpolation and extrapolation of dose measurements with different detector sizes to improve the spatial resolution of radiotherapy dosimetry as demonstrated for helical tomotherapy [J] . Andrea McNiven, Tomas Kron Physics in medicine and biology. . 2004,第16期

机译：用不同的探测器尺寸进行剂量测量的内插和外推，以提高放射线剂量学的空间分辨率，如螺旋体层摄影术所展示的
2. A New Silicon Drift Detector for High Spatial Resolution STEM-XEDS: Performance and Applications [J] . Patrick J. Phillips, Tadas Paulauskas, Neil Rowlands, Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . 2014,第4期

机译：适用于高空间分辨率STEM-XEDS的新型硅漂移检测器：性能和应用
3. Two dimensional studies of dynamics of electron clouds in silicon drift detectors [J] . Bellwied R., Beuttenmuller R. IEEE Transactions on Nuclear Science . 1999,第3期

机译：硅漂移探测器中电子云动力学的二维研究
4. Two dimensional studies of dynamics of electron clouds in silicon drift detectors [C] . Bellwied, R., Beuttenmuller, . 1998

机译：硅漂移探测器中电子云动力学的二维研究
5. Electron drift mobilities measurements and conduction band tail states in hydrogenated amorphous silicon-based materials (effects of germanium and carbon alloying). [D] . Wang, Qi. 1994

机译：氢化非晶硅基材料中的电子漂移迁移率测量和导带尾态（锗和碳合金的影响）。
6. Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS) [O] . Dale E. Newbury, Nicholas W. M. Ritchie -1

机译：通过扫描电子显微镜/硅漂移检测器能量色散X射线光谱法（SEM / SDD-EDS）进行高精度和高精度的元素微分析
7. High Spatial Resolution Quantification X-ray Microanalysis in a Field Emission Scanning Electron Microscope with an Annular Silicon Drift Detector [O] . Hendrix Demers, Nicolas Brodusch, Patrick Woo, 2015

机译：具有环形硅漂移探测器的场发射扫描电子显微镜中的高空间分辨率定量X射线微分析

Electron cloud size measurement in silicon drift detectors and spatial resolution improvement

摘要

著录项

相似文献

相关主题

期刊订阅