Characterization of active waveguide photonic devices using optical coherence domain reflectometry

Bruce D. Patterson

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Characterization of active waveguide photonic devices using optical coherence domain reflectometry

机译：使用光学相干域反射法表征有源波导光子器件

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摘要

Internal reflections occurring in the waveguides of incoherently emitting photonic devices are mapped using a novel optical coherence domain reflectometry (OCDR) technique, where the light source is the device itself. Such reflections may be caused by cleaved facets, inadvertent waveguide defects, or intentional submicrometer structures. How this OCDR technique is applied to the characterization of a 1.3-μm superluminescent diode with unintentional defects and with isolated and periodic structures produced by focused-ion beam milling is described. A two-pole network theory is used to model the observed effects.

机译：使用一种新颖的光学相干域反射法（OCDR）技术，可以对非相干发射光子设备的波导中发生的内部反射进行映射，其中光源就是设备本身。此类反射可能是由于切面切割，无意的波导缺陷或故意的亚微米结构引起的。描述了如何将该OCDR技术应用于表征1.3μm超发光二极管的特性，该二极管具有无意的缺陷，并且具有通过聚焦离子束铣削产生的隔离且周期性的结构。使用两极网络理论对观察到的效果进行建模。

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来源
《Optical engineering》 |1995年第8期|p.2289-2298|共10页
作者
Bruce D. Patterson;
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作者单位

Paul Scherrer Institute Badenerstrasse 569 CH-8048 Zuerich, Switzerland;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种 eng
中图分类光学仪器;
关键词
low-coherence interferometry; optical coherence domain reflectometry; waveguide defects; focused-ion beam milling;

机译：低相干干涉法;光学相干域反射法;波导缺陷;聚焦离子束铣削;

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8. High-Speed Optical Coherence Domain Reflectometry. (Reannouncement with NewAvailability Information) [R] . Swanson, E. A., Huang, D., Hee, M. R., 1992

机译：高速光学相干域反射仪。（重新公布新的可用性信息）

Characterization of active waveguide photonic devices using optical coherence domain reflectometry

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