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Micro-motion Analyzer Used For Dynamic Mems Characterization

机译:微动分析仪用于动态记忆表征

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摘要

A computer-controlled micro-motion analyzer (MMA) to study the dynamic behavior of movable structures of MEMS is described in this paper. It employs two optical nondestructive methods-computer microvision for in-plane motion measurement and phase-shifting interferometry for out-of-plane motion measurement. This fully integrated system includes a high-performance imaging system, drive electronics, data acquisition and data analysis software. This system can freeze the fast motions of MEMS devices using strobed illumination and measure motions in three dimensions with nanometer accuracy. The static measurement accuracy and repeatability of the system is calibrated by a step height standard which is certified by National Institute of Standards and Technology (NIST). The capabilities of this system are illustrated with a study of the dynamic behaviors of a surface micromachined polysilicon micro-resonator.
机译:本文介绍了一种计算机控制的微动分析仪(MMA),用于研究MEMS可移动结构的动态行为。它采用两种光学非破坏性方法:用于平面内运动测量的计算机显微成像和用于平面外运动测量的相移干涉术。该完全集成的系统包括高性能成像系统,驱动电子设备,数据采集和数据分析软件。该系统可以使用频闪照明冻结MEMS设备的快速运动,并以纳米精度测量三维运动。系统的静态测量精度和可重复性是通过美国国家标准技术研究院(NIST)认证的台阶高度标准进行校准的。通过研究表面微机械加工的多晶硅微谐振器的动态行为来说明该系统的功能。

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