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Polarization-dependent extraction properties of bare fiber probes

机译：裸露光纤探针的偏振相关提取特性

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摘要

Despite their modest spatial resolution, uncoated tapered fiber probes are now widely used by the nanoopticsncommunity for mapping, with scanning near-field optical microscopy (SNOM), the nonradiative fieldsnat the surface of optical and plasmonic microstructures and nanostructures. Given the significant complexitynof the vectorial optical phenomena associated with subwavelength structures, the correct interpretation ofnSNOM acquisitions requires a complete and accurate understanding of the intrinsic image-formation procedure.nIn this theoretical study, we show that the SNOM imaging process with uncoated tapered fibernprobes is highly polarization dependent and that the dominant effect is, surprisingly, the choice of opticalnfiber from which the tapered probe was fabricated. We demonstrate that although a tapered monomode fibernis unable to collect the component of the vector electric field parallel to the tip axis, a tapered multimodenfiber can successfully collect all the three field components. However, we show that the signal from the longitudinalnfield component is collected only 10% as efficiently as the signal from the two transverse fieldncomponents. © 2010 Optical Society of America
机译：尽管它们的空间分辨率适中，但无涂层的锥形光纤探头现在已被纳米光学社区广泛地用于制图，借助扫描近场光学显微镜（SNOM），光学和等离激元微观结构和纳米结构表面的非辐射场。考虑到与亚波长结构相关的矢量光学现象的复杂性，对nSNOM采集的正确解释需要对本征成像过程有完整而准确的理解。n在这项理论研究中，我们表明，未镀膜的锥形光纤探针的SNOM成像过程是高度复杂的取决于偏振的因素，并且显着的影响是选择锥形探针所用的光纤。我们证明，尽管锥形单模光纤无法收集平行于尖端轴的矢量电场分量，但锥形多模光纤可以成功收集所有三个场分量。但是，我们显示，与两个横向场分量相比，纵向场分量的信号收集效率仅为后者的10％。 ©2010美国眼镜学会

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  • 来源
    《Optics Letters》 |2010年第3期|p.1-3|共3页
  • 作者

    ◦T. Grosjean M. Mivelle and G. W. Burr;

  • 作者单位

    T. Grosjean,1,* M. Mivelle,1,2 and G. W. Burr21Département d’Optique P.M. Duffieux, Institut FEMTO-ST, CNRS UMR 6174, Université de Franche-Comté,16 Route de Gray, 25030 Besançon Cedex, France2IBM Almaden Research Center, D2/K13E, 650 Harry Road, San Jose, California 95120, USA*Corresponding author: thierry.grosjean@univ-fcomte.fr;

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