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Nondestructive analysis of coated periodic nanostructures from optical data

机译:从光学数据对涂层的周期纳米结构进行无损分析

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摘要

Optical data are essential for the accurate nondestructive determination of profiles of periodic structures in integrated-circuit technology. In rigorous coupled-wave analysis, the sample is generally modeled as layers consisting of a single material and the ambient. We extend present capabilities to the analysis of structures with overlayers and demonstrate our approach by determining quantitatively the thicknesses of top, sidewall, and bottom oxides of deliberately and naturally oxidized structures.
机译:光学数据对于集成电路技术中周期结构轮廓的准确无损确定至关重要。在严格的耦合波分析中,通常将样本建模为由单一材料和环境组成的层。我们将现有功能扩展到带有覆盖层的结构分析中,并通过定量确定有意和自然氧化的结构的顶部,侧壁和底部氧化物的厚度来展示我们的方法。

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