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Intrinsic detection of scattering phase with near-field scanning optical microscope

机译:近场扫描光学显微镜固有检测散射相

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摘要

We show that the interferometric interaction between the tip and the sample is inherently measured by annear-field scanning optical microscope (NSOM) operating in reflection mode. This is demonstrated by measuringnthe phase of the sample reflectivity on a standard multilayer system with variable thickness. The demonstratednintrinsic sensitivity to the phase has implications in the interpretation of images collected by using reflection modenNSOM. © 2010 Optical Society of America
机译:我们表明,尖端和样品之间的干涉测量相互作用是通过以反射模式运行的退火场扫描光学显微镜(NSOM)固有地测量的。这可以通过在厚度可变的标准多层系统上测量样品反射率的相位来证明。所证明的对相位的内在敏感性对使用反射模态NSOM收集的图像的解释有影响。 ©2010美国眼镜学会

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