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首页> 外文期刊>IEEE Transactions on Parallel and Distributed Systems >Constructing a reliable test&set bit
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Constructing a reliable test&set bit

机译：构建可靠的测试设置位

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摘要

The problem of computing with faulty shared bits is addressed. The focus is on constructing a reliable test&set bit from a collection of test&set bits of which some may be faulty. Faults are modeled by allowing operations on the faulty bits to return a special distinguished value, signaling that the operation may not have taken place. Such faults are called omission faults. Some of the constructions are required to be gracefully degrading for omission. That is, if the bound on the number of component bits which fail is exceeded, the constructed bit may suffer faults, but only faults which are no more severe than those of the components; and the constructed bit behaves as intended if the number of component bits which fail does not exceed that bound. Several efficient constructions are presented, and bounds on the space required are given. Our constructions for omission faults also apply to other fault models.
机译：解决了共享位错误的计算问题。重点是从一组可能存在故障的测试和设置位中构造可靠的测试和设置位。通过允许对故障位进行的操作返回一个特殊的可分辨值来对故障进行建模，以表明该操作可能尚未发生。这种故障称为遗漏故障。某些结构需要从容地进行降级。即，如果超过了失败的组成比特的数量的界限，则所构造的比特可能会遭受故障，而仅是不比组件的严重程度严重的故障。如果失败的组件位数不超过该限制，则构造的位将发挥预期的作用。介绍了几种有效的构造，并给出了所需空间的界限。我们对遗漏故障的构造也适用于其他故障模型。

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