...
首页> 外文期刊>Physical review letters >Local Charge Trapping in Conjugated Polymers Resolved by Scanning Kelvin Probe Microscopy
【24h】

Local Charge Trapping in Conjugated Polymers Resolved by Scanning Kelvin Probe Microscopy

机译:扫描开尔文探针显微镜分辨的共轭聚合物中的局部电荷陷阱

获取原文
获取原文并翻译 | 示例
           

摘要

The microstructure of conjugated polymers is heterogeneous on the length scale of individual polymer chains, but little is known about how this affects their electronic properties. Here we use scanning Kelvin probe microscopy with resolution-enhancing carbon nanotube tips to study charge transport on a 100 nm scale in a chain-extended, semicrystalline conjugated polymer. We show that the disordered grain boundaries between crystalline domains constitute preferential charge trapping sites and lead to variations on a 100 nm scale of the carrier concentration under accumulation conditions.
机译:共轭聚合物的微观结构在单个聚合物链的长度尺度上是异质的,但是鲜有关于其如何影响其电子性能的知之甚少。在这里,我们使用具有增强分辨率的碳纳米管尖端的扫描开尔文探针显微镜,研究扩链的半结晶共轭聚合物中100 nm范围内的电荷传输。我们表明,晶畴之间无序的晶界构成了优先的电荷俘获位点,并导致在积累条件下载流子浓度在100 nm尺度上发生变化。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号