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首页> 外文期刊>Physical review >In situ spectroscopy of intrinsic Bi_2Te_3 topological insulator thin films and impact of extrinsic defects
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In situ spectroscopy of intrinsic Bi_2Te_3 topological insulator thin films and impact of extrinsic defects

机译：Bi_2Te_3本征拓扑绝缘体薄膜的原位光谱及外在缺陷的影响

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摘要

Combined in situ x-ray photoemission spectroscopy, scanning tunneling spectroscopy, and angle resolved photoemission spectroscopy of molecular beam epitaxy grown Bi_2Te_3 on lattice mismatched substrates reveal high quality stoichiometric thin films with topological surface states without a contribution from the bulk bands at the Fermi energy. The absence of bulk states at the Fermi energy is achieved without counterdoping. We observe that the surface morphology and electronic band structure of Bi_2Te_3 are not affected by in vacuo storage and exposure to oxygen, whereas major changes are observed when exposed to ambient conditions. These films help define a pathwav towards intrinsic topological devices.
机译：在晶格失配的衬底上结合分子束外延生长的Bi_2Te_3的原位X射线光电子能谱，扫描隧道能谱和角度分辨光电子能谱揭示了具有拓扑表面状态的高质量化学计量薄膜，而费米能量处的体带没有贡献。在费米能量处不存在体态而没有反掺杂。我们观察到Bi_2Te_3的表面形态和电子能带结构不受真空存储和暴露于氧气的影响，而暴露于环境条件则观察到主要变化。这些影片有助于定义通往固有拓扑设备的途径。

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  • 来源
    《Physical review》 |2015年第3期|035405.1-035405.7|共7页
  • 作者

    P. Ngabonziza; R. Heimbuch; N. de Jong; R. A. Klaassen; M. P. Stehno; M. Snelder; A. Solmaz; S. V. Ramankutty; E. Frantzeskakis; E. van Heumen; G. Koster; M. S. Golden; H. J. W. Zandvliet; A. Brinkman;

  • 作者单位

    Faculty of Science and Technology and MESA+ Institute for Nanotechnology, University of Twente, 7500 AE Enschede, The Netherlands;

    Faculty of Science and Technology and MESA+ Institute for Nanotechnology, University of Twente, 7500 AE Enschede, The Netherlands;

    Van der Waals-Zeeman Institute, University of Amsterdam, Science Park 904,1098 XH, Amsterdam, Netherlands;

    Faculty of Science and Technology and MESA+ Institute for Nanotechnology, University of Twente, 7500 AE Enschede, The Netherlands;

    Faculty of Science and Technology and MESA+ Institute for Nanotechnology, University of Twente, 7500 AE Enschede, The Netherlands;

    Faculty of Science and Technology and MESA+ Institute for Nanotechnology, University of Twente, 7500 AE Enschede, The Netherlands;

    Faculty of Science and Technology and MESA+ Institute for Nanotechnology, University of Twente, 7500 AE Enschede, The Netherlands;

    Van der Waals-Zeeman Institute, University of Amsterdam, Science Park 904,1098 XH, Amsterdam, Netherlands;

    Van der Waals-Zeeman Institute, University of Amsterdam, Science Park 904,1098 XH, Amsterdam, Netherlands;

    Van der Waals-Zeeman Institute, University of Amsterdam, Science Park 904,1098 XH, Amsterdam, Netherlands;

    Faculty of Science and Technology and MESA+ Institute for Nanotechnology, University of Twente, 7500 AE Enschede, The Netherlands;

    Van der Waals-Zeeman Institute, University of Amsterdam, Science Park 904,1098 XH, Amsterdam, Netherlands;

    Faculty of Science and Technology and MESA+ Institute for Nanotechnology, University of Twente, 7500 AE Enschede, The Netherlands;

    Faculty of Science and Technology and MESA+ Institute for Nanotechnology, University of Twente, 7500 AE Enschede, The Netherlands;

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  • 正文语种 eng
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  • 关键词

    adsorbed layers and thin films; electron states at surfaces and interfaces; scanning tunneling microscopy (including chemistry induced with STM);

    机译：吸附层和薄膜;表面和界面的电子态;扫描隧道显微镜（包括用STM诱导的化学反应）;

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