Quantitative determination of the Mn site distribution in ultrathin Ga_(0.80)Mn_(0.20)As layers with high critical temperatures: A Rutherford backscattering channeling investigation

著录项

• 来源
  《Physical review》 |2014年第11期|115323.1-115323.5|共5页
• 作者

  D. Benzeggouta; Kh. Khazen; I. Vickridge; H. J. von Bardeleben; L. Chen; X. Z. Yu; J. H. Zhao;

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• 作者单位

  Sorbonne Universites, UPMC Universite Paris 06, UMR7588, Institut des NanoSciences de Paris, F-75005, Paris, France;

  Sorbonne Universites, UPMC Universite Paris 06, Laboratoire des Materiaux Mesoscopiques et Nanometriques, F-75005, Paris, France;

  Sorbonne Universites, UPMC Universite Paris 06, UMR7588, Institut des NanoSciences de Paris, F-75005, Paris, France ,CNRS, UMR7588, Institut des NanoSciences de Paris, F-75005, Paris, France;

  Sorbonne Universites, UPMC Universite Paris 06, UMR7588, Institut des NanoSciences de Paris, F-75005, Paris, France ,CNRS, UMR7588, Institut des NanoSciences de Paris, F-75005, Paris, France;

  State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, P. O. Box 912, Beijing 100083, China;

  State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, P. O. Box 912, Beijing 100083, China;

  State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, P. O. Box 912, Beijing 100083, China;

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• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  magnetic semiconductors; spectrometers and spectroscopic techniques; intrinsic properties of magnetically ordered materials;

  机译：磁性半导体光谱仪和光谱技术;磁性有序材料的固有特性;