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B and N doping in graphene ruled by grain boundary defects

机译:石墨烯中的B和N掺杂受晶界缺陷的支配

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The energetics and electronic properties of substitutional B (B_c) and N (N_c) doping, and BN codoping in graphene with distinct grain boundary defects were investigated by ab initio simulations. Our results indicate that a single B or N impurity atoms and an isolated BN pair prefer to incorporate into the grain boundary region. In particular, we find that the formation of N_c along the grain boundary sites is an exothermic process. It suggests that hexagonal-BN (h-BN) or h-BN and carbon (h-BNC) domains may be patterned by these defective regions. The electronic properties of those doped grain boundary systems have been examined through scanning tunneling microscopy (STM) simulations and electronic band-structure calculations. We find a quite different STM picture for the Be- and Nc-doped grain boundaries when compared with the same impurities on the perfect graphene sheet.
机译:通过从头算研究,研究了具有明显晶界缺陷的石墨烯中的B(B_c)和N(N_c)掺杂以及BN共掺杂的能量和电子性质。我们的结果表明,一个单一的B或N杂质原子和一个孤立的BN对更倾向于掺入晶界区域。特别地,我们发现沿晶界部位形成N_c是一个放热过程。这表明六边形BN(h-BN)或h-BN以及碳(h-BNC)域可以由这些缺陷区域构图。这些掺杂的晶界系统的电子性能已通过扫描隧道显微镜(STM)模拟和电子能带结构计算得到了检验。当与理想石墨烯片材上的相同杂质进行比较时,我们发现Be和Nc掺杂的晶界的STM图片完全不同。

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