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X-ray cross-correlation analysis applied to disordered two-dimensional systems

机译：X射线互相关分析应用于无序二维系统

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摘要

Angular x-ray cross-correlation analysis (XCCA) is an approach to study the structure of disordered systems using the results of coherent x-ray scattering experiments. Here, we present the results of simulations that validate our theoretical findings for XCCA obtained in a previous paper [Altarelli et al, Phys. Rev. B 82, 104207 (2010)]. We consider as a model two-dimensional (2D) disordered systems composed of noninteracting colloidal clusters with fivefold symmetry and with orientational and positional disorder. We simulate a coherent x-ray scattering in the far field from such disordered systems and perform the angular cross-correlation analysis of calculated diffraction data. The results of our simulations show the relation between the Fourier series representation of the cross-correlation functions (CCFs) and different types of correlations in disordered systems. The dependence of structural information extracted by XCCA on the density of disordered systems and the degree of orientational disorder of clusters is investigated. The statistical nature of the fluctuations of the CCFs in the model "single-shot" experiments is demonstrated and the potential of extracting structural information from the analysis of CCFs averaged over a large number of diffraction patterns is discussed. We also demonstrate the effect of partial coherence of the incident x-ray beams on the results of XCCA.
机译：角X射线互相关分析（XCCA）是一种使用相干X射线散射实验结果研究无序系统结构的方法。在这里，我们提供了模拟结果，这些结果验证了我们在先前论文中获得的XCCA理论发现[Altarelli等，Phys。 B 82，104207（2010）。我们将二维（2D）无序系统视为模型，该系统由具有五重对称性以及方向性和位置性无序的非相互作用胶体簇组成。我们在这种无序系统的远场中模拟相干x射线散射，并对计算出的衍射数据进行角度互相关分析。我们的仿真结果显示了互相关函数（CCF）的傅里叶级数表示与无序系统中不同类型的相关性之间的关系。研究了XCCA提取的结构信息对无序系统密度和簇取向无序度的依赖性。演示了模型“单次”实验中CCF波动的统计性质，并讨论了从对大量衍射图样求平均值的CCF分析中提取结构信息的潜力。我们还证明了入射X射线束的部分相干性对XCCA结果的影响。

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  • 来源
    《Physical review》 |2012年第18期|p.184204.1-184204.19|共19页
  • 作者

    R. P. Kurta; M. Altarelli; E. Weckert; I. A. Vartanyants;

  • 作者单位

    Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, D-22607 Hamburg, Germany;

    European X-ray Free-Electron Laser Facility, Notkestrasse 85, D-22607 Hamburg, Germany;

    Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, D-22607 Hamburg, Germany;

    Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, D-22607 Hamburg, Germany,National Research Nuclear University, 'MEPhI', 115409 Moscow, Russia;

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  • 正文语种 eng
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  • 关键词

    amorphous semiconductors, metals, and alloys; glasses;

    机译：非晶半导体;金属和合金;眼镜;

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